Invention Grant
- Patent Title: Controlling via critical dimension with a titanium nitride hard mask
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Application No.: US16798374Application Date: 2020-02-23
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Publication No.: US10886197B2Publication Date: 2021-01-05
- Inventor: Yann Mignot , Muthumanickam Sankarapandian , Yongan Xu
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Otterstedt, Wallace & Kammer, LLP
- Agent Abdy Raissinia
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768

Abstract:
An Nblock layer is deposited onto a semiconductor substrate that includes metal deposits. A titanium nitride (TiN) layer is deposited directly onto the Nblock layer; an oxide layer is deposited directly onto the TiN layer; and a via hole is formed through the oxide and TiN layer to contact bottom interconnect. The via hole is aligned to one of the metal deposits in the substrate.
Information query
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