- Patent Title: Test circuit, array substrate, display panel, and display device
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Application No.: US16462638Application Date: 2018-10-10
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Publication No.: US10886301B2Publication Date: 2021-01-05
- Inventor: Chunping Long , Hui Li , Xinyin Wu
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Calfee, Halter & Griswold LLP
- Priority: CN201721318496U 20171013
- International Application: PCT/CN2018/109643 WO 20181010
- International Announcement: WO2019/072189 WO 20190418
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L27/12 ; G01R31/50 ; G02F1/1343 ; G02F1/1362 ; G09G3/00 ; H01L29/417 ; H01L29/423

Abstract:
An array substrate, a display panel, and a display device. The array substrate has a display area and a non-display area surrounding the display area. The array substrate further includes a plurality of signal lines located in the display area, a plurality of test signal lines and a plurality of test control transistors located in the non-display area and respectively corresponding to the plurality of signal lines. Each of the signal lines is connected to a respective one of the test signal lines by a respective one of the test control transistors. The plurality of test control transistors each have a channel width-to-length ratio between 10 and 200.
Public/Granted literature
- US20200075632A1 TEST CIRCUIT, ARRAY SUBSTRATE, DISPLAY PANEL, AND DISPLAY DEVICE Public/Granted day:2020-03-05
Information query
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