Invention Grant
- Patent Title: Fast EDFA gain spectrum characterization using weak probe and fourier sampling
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Application No.: US16487981Application Date: 2018-02-22
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Publication No.: US10887007B2Publication Date: 2021-01-05
- Inventor: Daniel Kilper , Weiyang Mo
- Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA
- Applicant Address: US AZ Tucson
- Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA
- Current Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA
- Current Assignee Address: US AZ Tucson
- Agency: Mayer & Williams PC
- Agent Stuart H. Mayer
- International Application: PCT/US2018/019206 WO 20180222
- International Announcement: WO2018/156752 WO 20180830
- Main IPC: H04J14/02
- IPC: H04J14/02 ; H04B10/077 ; H04B10/079 ; H04B10/50

Abstract:
A method is provided for determining the gain spectrum of an optical amplifier such as an erbium doped optical amplifier (EDFA). In accordance with the method, an optical amplifier such as an EDFA that is to accommodate a specified number of channels at different optical wavelengths is provided. A subset of the specified number of channels at which gain is to be measured is selected. The number of channels in the subset is determined based at least in part on a number of samples required by the Nyquist sampling theorem to reconstruct the gain spectrum. A gain value for each channel in the selected subset of channels is measured for a probe signal that does not perturb the gain spectrum of the EDFA by more than a prescribed amount. The gain spectrum for the EDFA is constructed from the measured gain values.
Public/Granted literature
- US20200028584A1 FAST EDFA GAIN SPECTRUM CHARACTERIZATION USING WEAK PROBE AND FOURIER SAMPLING Public/Granted day:2020-01-23
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