Invention Grant
- Patent Title: Inspection device
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Application No.: US16725073Application Date: 2019-12-23
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Publication No.: US10887501B2Publication Date: 2021-01-05
- Inventor: Munehiro Takayama , Masataka Toda , Yukio Ichikawa
- Applicant: AISIN SEIKI KABUSHIKI KAISHA
- Applicant Address: JP Kariya
- Assignee: AISIN SEIKI KABUSHIKI KAISHA
- Current Assignee: AISIN SEIKI KABUSHIKI KAISHA
- Current Assignee Address: JP Kariya
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2018-240895 20181225
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N5/225

Abstract:
An inspection device includes: an inspection pattern creating unit that creates an inspection pattern in which first regions each colored with a color different from each other and second regions each colored with a mixed color obtained by mixing at least two of colors with which the first regions are colored are alternately arranged; an irradiation unit that irradiates a surface of an inspection target with the inspection pattern while sliding the inspection pattern by a movement amount; a captured image acquisition unit that acquires a captured image obtained by imaging the surface of the inspection target irradiated with the inspection pattern; and a determination unit that generates color component images obtained by separating the acquired captured image for each of color components of the colors and determines whether or not there is a defect in the surface of the inspection target based on the color component images.
Information query