Invention Grant
- Patent Title: Automatic analysis control device and program
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Application No.: US14012427Application Date: 2013-08-28
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Publication No.: US10890566B2Publication Date: 2021-01-12
- Inventor: Yuji Katsuyama
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Main IPC: G01N30/24
- IPC: G01N30/24 ; G01N30/86 ; G01N30/88

Abstract:
A control device for automatic analysis including a unit which stores an analysis parameter file in which setting values of multiple setting items related to analytical equipment control are specified; a unit which describes at least identification information for the sample to be analyzed and the analytical parameters file to be used for analysis, for multiple analyses to be executed in the analysis device, and generates an analysis schedule table which describes setting values relating to one or more of the multiple setting items contained in the analytical parameters file for each analysis; and a control unit which controls the operation of the analytical equipment according to the analysis schedule table. The control unit is made such that the setting values specified in the analysis schedule table are applied preferentially for setting items for which the setting value is described in both the analytical parameter file and analysis schedule table.
Public/Granted literature
- US20150066388A1 AUTOMATIC ANALYSIS CONTROL DEVICE AND PROGRAM Public/Granted day:2015-03-05
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