- Patent Title: Abnormality determination apparatus, non-transitory computer readable medium encoded with a program, abnormality determination system and abnormality determination method
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Application No.: US16254034Application Date: 2019-01-22
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Publication No.: US10890892B2Publication Date: 2021-01-12
- Inventor: Susumu Maekawa , Hirohide Tsunoda
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2018-016179 20180201
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G05B19/4065 ; G05B19/404

Abstract:
An abnormality determination apparatus, which determines abnormality of a temperature sensor in a machine tool, includes: a temperature pattern storage unit which stores a normal pattern indicating temperature change relative to machining time for a machining classification of the machine tool; a temperature data acquisition unit which acquires temperature data outputted by the temperature sensor provided to the machine tool; a machining classification determination unit which determines a machining classification of the machine tool; a comparison data acquisition unit which extracts the normal pattern relative to a determined machining classification from the temperature pattern storage unit; a comparison unit which compares the extracted normal pattern, and as acquired pattern indicating temperature change relative to machining time according to the acquired temperature data; and an abnormality determination unit which determines abnormality of a temperature sensor based on a comparison result.
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