Invention Grant
- Patent Title: Method and device for identifying problematic component in storage system
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Application No.: US16167845Application Date: 2018-10-23
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Publication No.: US10891178B2Publication Date: 2021-01-12
- Inventor: Bing Liu , Man Lv , Fang You
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agent Krishnendu Gupta; Peter Jovanovic
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; H04L29/08 ; H04L12/24 ; G06F13/40

Abstract:
Embodiments of the present disclosure relate to a method and device for identifying a problematic component in a storage system. The method comprises determining, based on history error logs of components of the storage system, a graph indicating error information of the components, where nodes in the graph indicate the components, and edges in the graph indicate connections between the components; the method further comprises identifying, based on the graph, an error source in the components of the storage system to be the problematic component. With the method and device of the present disclosure, the error source in the storage system can be identified more accurately and effectively and user experience can be enhanced.
Public/Granted literature
- US20190129785A1 METHOD AND DEVICE FOR IDENTIFYING PROBLEMATIC COMPONENT IN STORAGE SYSTEM Public/Granted day:2019-05-02
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