Invention Grant
- Patent Title: Instrumentation diagram data generation device, instrumentation diagram search system, and computer readable medium
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Application No.: US16323719Application Date: 2017-02-07
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Publication No.: US10891332B2Publication Date: 2021-01-12
- Inventor: Naoya Fukuoka , Hiroki Kawano , Tomooki Ukiana , Toshihiro Mega , Tomohiro Narui , Tomohiro Sato , Hiroto Takahashi
- Applicant: MITSUBISHI ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2016-192640 20160930
- International Application: PCT/JP2017/004436 WO 20170207
- International Announcement: WO2018/061240 WO 20180405
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/58 ; G06F16/538 ; G06F16/535 ; G06F16/25 ; G06F30/12

Abstract:
A control method analysis unit acquires a correspondence relation between signs and model numbers from an apparatus table of an instrumentation diagram, and acquires signs and apparatus symbols, and connection relation among apparatuses, from a drawing of the instrumentation diagram. Subsequently, the control method analysis unit acquires an apparatus classification drawn on the diagram by searching an instrumentation apparatus classification database based on the model numbers, and decides a temperature control method employed by an instrumentation indicated in the instrumentation diagram, from the apparatus classification and the connection relation. The control method analysis unit then links the decided temperature control method to the instrumentation diagram accumulated in a case database. A search processing unit extracts a corresponding instrumentation diagram by searching the case database based on a temperature control method designated as a search condition.
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