Dynamic embedded integrated circuit in trackable item
Abstract:
A method for determining the authenticity of a trackable item is provided. The method includes maintaining a database including first scan history data associated with a given integrated circuit associated with a given item. Second scan history data associated with the given integrated circuit is received. An authenticity of the given item is determined based on a comparison of the first scan history data to the second scan history data.
Public/Granted literature
Information query
Patent Agency Ranking
0/0