Invention Grant
- Patent Title: Analog-to-digital converter with a supplementary digital-to-analog converter for offset and gain error measurements
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Application No.: US16810280Application Date: 2020-03-05
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Publication No.: US10897261B1Publication Date: 2021-01-19
- Inventor: Josef Niederl , Peter Bogner
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
A switched-capacitor analog-to-digital converter (ADC) includes: a main digital-to-analog converter (DAC) circuit; a comparator coupled to the main DAC circuit and configured to determine whether the input to the comparator exceeds a pre-determined threshold; and a supplementary DAC circuit coupled to the main DAC circuit, wherein the switched-capacitor ADC is configured to operate in at least one of a first mode or a second mode, wherein in the first mode for measuring an offset of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift a voltage at an output of the main DAC circuit by a first value having a first polarity, and wherein in the second mode for measuring a full-scale gain error of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift the voltage at the output of the main DAC circuit by a second value having a second polarity opposite the first polarity.
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