Invention Grant
- Patent Title: Spectroscopic measurement apparatus, electronic apparatus, and spectroscopic measurement method
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Application No.: US16528735Application Date: 2019-08-01
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Publication No.: US10900831B2Publication Date: 2021-01-26
- Inventor: Tsugio Gomi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2018-145666 20180802
- Main IPC: G01J3/10
- IPC: G01J3/10 ; G01J3/12

Abstract:
A spectroscopic measurement apparatus includes a light emitter simultaneously emitting light including light having all wavelengths in a wavelength range from 400 nm to 700 nm to a measurement target, a light disperser dispersing a reflected light reflected by the measurement target to a predetermined wavelength, a light receiver that receives the light dispersed by the light disperser and outputs a second light reception amount indicating a light intensity of the received light, and a calculator that receives the second light reception amount of each wavelength and calculates a reflection spectrum when the measurement target is irradiated with light, in which the calculator calculates reflectance of a predetermined wavelength using the second light reception amounts of a plurality of wavelengths.
Public/Granted literature
- US20200041343A1 SPECTROSCOPIC MEASUREMENT APPARATUS, ELECTRONIC APPARATUS, AND SPECTROSCOPIC MEASUREMENT METHOD Public/Granted day:2020-02-06
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