Invention Grant
- Patent Title: Far-field optical super-resolution microscopy method
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Application No.: US16496345Application Date: 2017-11-28
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Publication No.: US10900895B2Publication Date: 2021-01-26
- Inventor: Feng Li , Honglian Guo
- Applicant: South China University of Technology
- Applicant Address: CN Guangdong
- Assignee: South China University of Technology
- Current Assignee: South China University of Technology
- Current Assignee Address: CN Guangdong
- Agency: Masuvalley & Partners
- Priority: CN201710175143 20170322
- International Application: PCT/CN2017/113369 WO 20171128
- International Announcement: WO2018/171243 WO 20180927
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/63 ; G01N29/24

Abstract:
The present invention discloses a far-field optical super-resolution microscopy method, and particularly relates to an optical super-resolution microscopy method for micro-structures on the surface of a sample. The present invention measures the vibration modes of different micro-samples via a laser interference vibrometer, and utilizes different eigen-vibration frequencies of the micro-structures on the surface of the sample to render, under the cooperation of a sub-nanometer two-dimensional displacement scanning translation stage, a high-resolution spatial position, an excitation frequency vibration spectrum and an image pattern, thus realizing super-resolution microscopy imaging. Since the present invention utilizes the different vibration frequencies of the micro-structures on the surface of the sample to perform marking, and adopts a laser to excite and detect the vibration of the micro-structures, the method has the characteristics of causing no mark, no damage and no contamination to the sample.
Public/Granted literature
- US20200025682A1 FAR-FIELD OPTICAL SUPER-RESOLUTION MICROSCOPY METHOD Public/Granted day:2020-01-23
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