Systematic methodology to remove reflections from I/O measurements
Abstract:
Embodiments of the present invention reconstruct a waveform at a receiver-end of a channel from an observed waveform physically measured at a probe point near the middle of the channel, where the channel is corrupted by reflections. The channel may be a memory channel of a high-speed I/O interface, for example. Equations to derive the waveform may be created using linear network analysis and/or signal processing, for example. S-parameters may be derived from simulated models representing components from the probe point to the load. The s-parameters together with the load impedance are used to recreate the desired waveform free from corruption due to reflections.
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