- Patent Title: Systematic methodology to remove reflections from I/O measurements
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Application No.: US15673302Application Date: 2017-08-09
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Publication No.: US10901017B2Publication Date: 2021-01-26
- Inventor: Sunil Sudhakaran
- Applicant: NVIDIA CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: NVIDIA CORPORATION
- Current Assignee: NVIDIA CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Zilka-Kotab, P.C.
- Main IPC: G01R23/167
- IPC: G01R23/167 ; G06F17/12 ; G01R31/28 ; G01R29/26

Abstract:
Embodiments of the present invention reconstruct a waveform at a receiver-end of a channel from an observed waveform physically measured at a probe point near the middle of the channel, where the channel is corrupted by reflections. The channel may be a memory channel of a high-speed I/O interface, for example. Equations to derive the waveform may be created using linear network analysis and/or signal processing, for example. S-parameters may be derived from simulated models representing components from the probe point to the load. The s-parameters together with the load impedance are used to recreate the desired waveform free from corruption due to reflections.
Public/Granted literature
- US20190049496A1 SYSTEMATIC METHODOLOGY TO REMOVE REFLECTIONS FROM I/O MEASUREMENTS Public/Granted day:2019-02-14
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