Invention Grant
- Patent Title: Physical parameter measuring
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Application No.: US15649769Application Date: 2017-07-14
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Publication No.: US10905376B2Publication Date: 2021-02-02
- Inventor: Steven D. Baker
- Applicant: Welch Allyn, Inc.
- Applicant Address: US NY Skaneateles Falls
- Assignee: Welch Allyn, Inc.
- Current Assignee: Welch Allyn, Inc.
- Current Assignee Address: US NY Skaneateles Falls
- Agency: Merchant & Gould P.C.
- Main IPC: A61B5/00
- IPC: A61B5/00 ; G06F19/00 ; G16H40/63 ; G16H20/00 ; G16H40/67 ; A61B5/11 ; A61B5/021 ; A61B5/024 ; A61B5/0402 ; A61B5/08 ; G16H80/00

Abstract:
A system for detecting one or more physical assessment parameters of a subject includes a sensing patch and a processor. The sensing patch is configured to sense signals from the subject corresponding to one or more physical assessment parameters, reduce sensed parameter data corresponding to the sensed signals, and transmit the sensed parameter data. The sensing patch also includes at least one adjustable sensing patch parameter. The processor is separate from the sensing patch and configured to receive the sensed parameter data from the sensing patch and transmit a command to the sensing patch. The sensing patch is configured to perform different amounts of data reduction on the sensed parameter data before transmitting the sensed parameter data to the processor. These different amounts of data reduction are determined at least in part by one or more system parameters.
Public/Granted literature
- US20190015048A1 PHYSICAL PARAMETER MEASURING Public/Granted day:2019-01-17
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