Invention Grant
- Patent Title: Sample measurement apparatus and method of measuring samples
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Application No.: US15592238Application Date: 2017-05-11
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Publication No.: US10908173B2Publication Date: 2021-02-02
- Inventor: Mitsuo Yamasaki , Tomonori Okazaki , Noriyuki Nakanishi , Takahiro Saino
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2014-232239 20141114
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/00

Abstract:
A sample measurement apparatus according to one or more embodiments includes a processing unit that aspirates a sample inside a sample container and measures the sample; a transfer unit that includes a holder to hold the sample container, and that picks up the sample container from a rack capable of storing the sample containers at storage positions on a row and transfers the sample container to the processing unit; and a detection unit that is attached to the holder and is movable integrally with the holder, and that detects whether or not there is the sample container at each of the storage positions.
Public/Granted literature
- US20170242046A1 SAMPLE MEASUREMENT APPARATUS AND METHOD OF MEASURING SAMPLES Public/Granted day:2017-08-24
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