Invention Grant
- Patent Title: Estimating interval anisotropy parameter for pre-stack depth migration using a least-squares method
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Application No.: US15567122Application Date: 2016-10-25
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Publication No.: US10908309B2Publication Date: 2021-02-02
- Inventor: Fan Xia
- Applicant: Landmark Graphics Corporation
- Applicant Address: US TX Houston
- Assignee: Landmark Graphics Corporation
- Current Assignee: Landmark Graphics Corporation
- Current Assignee Address: US TX Houston
- Agency: Parker Justiss, P.C.
- Agent Tenley Krueger
- International Application: PCT/US2016/058692 WO 20161025
- International Announcement: WO2018/080460 WO 20180503
- Main IPC: G01V1/36
- IPC: G01V1/36 ; G01V1/28 ; G01V1/30

Abstract:
An apparatus and a method for estimating interval anellipticity parameter by inversing effective anellipticity parameter in the depth domain using a least-squares method. One embodiment of interval anellipticity parameter estimator includes: 1) an interface configured to receive seismic data and borehole information; 2) a depth convertor configured to obtain a function of depth of effective anisotropy parameter based on said borehole information; 3) an inverse transformer configured to set up said function of depth of effective anisotropy parameter as a least-squares fitting problem based on said P-wave data; and 4) an iterative solver configured to use iterative methods to solve said least-squares fitting problem and to obtain an anisotropy model containing interval anellipticity parameter.
Public/Granted literature
- US20190235113A1 ESTIMATING INTERVAL ANISOTROPY PARAMETER FOR PRE-STACK DEPTH MIGRATION USING A LEAST-SQARES METHOD Public/Granted day:2019-08-01
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