Invention Grant
- Patent Title: Multiple measurements aggregated at multiple levels of execution of a workload
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Application No.: US15034356Application Date: 2013-12-20
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Publication No.: US10909117B2Publication Date: 2021-02-02
- Inventor: Alkiviadis Simitsis , William K. Wilkinson
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- International Application: PCT/US2013/076779 WO 20131220
- International Announcement: WO2015/094312 WO 20150625
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/2455 ; G06F16/248 ; G06F16/2453 ; G06F16/21

Abstract:
Described herein are techniques for identifying a path in a workload that may be associated with a deviation. A workload may be associated with multiple measurements of a plurality of metrics generated during execution of the workload. The multiple measurements may be aggregated at multiple levels of execution. One or more measurements may be compared to one or more other measurements or estimates to determine whether there is a deviation from an expected correlation. If determined that there is a deviation, a path can be identified in the workload that may be associated with the deviation.
Public/Granted literature
- US20160292230A1 IDENTIFYING A PATH IN A WORKLOAD THAT MAY BE ASSOCIATED WITH A DEVIATION Public/Granted day:2016-10-06
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