Invention Grant
- Patent Title: Appearance inspection system, image processing device, setting device, and inspection method
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Application No.: US16248813Application Date: 2019-01-16
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Publication No.: US10909672B2Publication Date: 2021-02-02
- Inventor: Shingo Inazumi , Yutaka Kato , Naoya Nakashita
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP2018-044036 20180312
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N5/225 ; H04N5/232 ; B25J9/16

Abstract:
An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.
Public/Granted literature
- US20190279354A1 APPEARANCE INSPECTION SYSTEM, IMAGE PROCESSING DEVICE, SETTING DEVICE, AND INSPECTION METHOD Public/Granted day:2019-09-12
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