Select line voltage waveform real-time monitor for non-volatile memory
Abstract:
An apparatus comprising strings of non-volatile memory cells is disclosed. Each string comprises non-volatile memory cells, an operative select gate, and a dummy select gate. The apparatus comprises a select line connected to the operative select gate of each string, and a dummy line connected to the dummy select gate of each string. The dummy line is an immediate neighbor to the select line. The apparatus comprises a control circuit configured to apply a voltage waveform to the select line while the dummy line is floating. The control circuit is configured to detect a floating voltage on the dummy line while applying the voltage waveform to the select line. The control circuit is configured to determine a condition of the voltage waveform at a target location on the select line based on the floating voltage on the dummy line.
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