Invention Grant
- Patent Title: Arrays of cross-point memory structures
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Application No.: US16789368Application Date: 2020-02-12
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Publication No.: US10910255B2Publication Date: 2021-02-02
- Inventor: Scott E. Sills
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L27/24
- IPC: H01L27/24 ; H01L21/762 ; G11C8/12 ; H01L27/11502 ; H01L21/8239 ; H01L27/10 ; H01L27/11585 ; G11C11/22 ; H01L27/102

Abstract:
Some embodiments include a memory array having a first set of lines extending along a first direction, and a second set of lines over the first set of lines and extending along a second direction. Lines of the second set cross lines of the first set at cross-point locations. Memory structures are within the cross-point locations. Each memory structure includes a top electrode material, a bottom electrode material and a programmable material. Rails of insulative material extend parallel to the lines of the second set and alternate with the lines of the second set along the first direction. The programmable material has first regions within the memory structures and second regions over the rails of insulative material. A planarized surface extends across the lines of the second set and across the second regions of the programmable material. Some embodiments include methods of forming memory arrays.
Public/Granted literature
- US20200185265A1 Arrays of Cross-Point Memory Structures Public/Granted day:2020-06-11
Information query
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