Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US16859523Application Date: 2020-04-27
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Publication No.: US10910383B2Publication Date: 2021-02-02
- Inventor: Beom-Yong Kim , Hun Lee , Deok-Sin Kil
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2017-0033829 20170317
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L27/108 ; H01L21/02 ; H01L49/02 ; H01L21/311

Abstract:
A method for fabricating a semiconductor device includes: forming a bottom electrode of a high aspect ratio; forming an interface layer by sequentially performing a first plasma process and a second plasma process onto a surface of the bottom electrode; forming a dielectric layer over the interface layer; and forming a top electrode over the dielectric layer.
Public/Granted literature
- US20200258888A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2020-08-13
Information query
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