Examples of complementary metal oxide semiconductor (CMOS) image sensor are provided. One example CMOS image sensor includes a first plurality of pixel units that are arranged in lattice manner and that are obtained by rotating a rectangular area including four sets of photodiodes and transfer gates (TX) and one charge accumulation portion by 45 degrees. The example CMOS image sensor further includes a second plurality of pixel units that are arranged by shifted in a horizon direction by half of the distance between the centers of the adjacent pixel units in the horizon direction and shifted in a vertical direction by half of the distance between the centers of the adjacent pixel units in the vertical direction from the positions of the respective pixel units of the first plurality of pixel units.