Invention Grant
- Patent Title: Conducted OTA test fixture
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Application No.: US16774601Application Date: 2020-01-28
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Publication No.: US10910729B2Publication Date: 2021-02-02
- Inventor: Esther Sienkiewicz , Adrien Comeau , Henrik Hallenberg
- Applicant: Telefonaktiebolaget LM Ericsson (publ)
- Applicant Address: SE Stockholm
- Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee: Telefonaktiebolaget LM Ericsson (publ)
- Current Assignee Address: SE Stockholm
- Agency: Withrow & Terranova, PLLC
- Main IPC: H01Q13/18
- IPC: H01Q13/18 ; H01Q21/06 ; G01R29/10 ; H04B17/12 ; H01Q3/26 ; H01Q1/52 ; H01Q1/38 ; H01Q21/00 ; H01Q1/42 ; H01Q1/40 ; H01Q1/24

Abstract:
Systems and methods relating to performing individual transmit and/or receive measurements for each antenna element in an antenna array implemented on an Substrate Integrated Antenna Array (SIAA) are disclosed. In some embodiments, an SIAA comprises a substrate, one or more antenna elements at a surface of the substrate, and an electrically conductive via fence having a first side electrically coupled to ground within the substrate and a second side at the surface of the substrate, the electrically conductive via fence separately circumscribing each antenna element of the one or more antenna elements within the substrate. The SIAA enables the use of a respective test structure to perform per-antenna element measurements.
Public/Granted literature
- US20200168999A1 CONDUCTED OTA TEST FIXTURE Public/Granted day:2020-05-28
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