Invention Grant
- Patent Title: Magnetic field sensor system and method for rotation angle measurement
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Application No.: US16113229Application Date: 2018-08-27
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Publication No.: US10914611B2Publication Date: 2021-02-09
- Inventor: Stephan Marauska , Edwin Schapendonk , Jörg Kock , Dennis Helmboldt , Ralf van Otten , Jaap Ruigrok
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Agent Charlene R. Jacobsen
- Main IPC: G01D5/16
- IPC: G01D5/16

Abstract:
A system includes a magnet having an axis of rotation, the magnet being configured to produce a magnetic field. The system further includes a plurality of magnetoresistive sensor elements, each of the magnetoresistive sensor elements having a magnetic free layer configured to generate a vortex magnetization pattern in the magnetic free layer, and the magnetoresistive sensor elements being configured to produce output signals in response to the magnetic field. A rotation angle of a rotating element to which the magnet is coupled may be determined using the plurality of output signals.
Public/Granted literature
- US20200064157A1 MAGNETIC FIELD SENSOR SYSTEM AND METHOD FOR ROTATION ANGLE MEASUREMENT Public/Granted day:2020-02-27
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