Invention Grant
- Patent Title: X-ray spectrometer
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Application No.: US15865992Application Date: 2018-01-09
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Publication No.: US10914694B2Publication Date: 2021-02-09
- Inventor: Joel Ullom , Galen O'Neil , Luis Miaja Avila , Kevin Silverman , Daniel Swetz , Ralph Jimenez , William Bertrand Doriese , Gene Hilton , Carl Reintsema , Daniel Schmidt , Bradley K. Alpert , Jens Uhlig , Young Joe , Wilfred K. Fullagar , Villy Sundstrom , Ilari Maasilta , Joseph Fowler
- Applicant: Government of the United States of America, as represented by the Secretary of Commerce
- Applicant Address: US MD Gaithersburg
- Assignee: Government of the United States of America, as represented by the Secretary of Commerce
- Current Assignee: Government of the United States of America, as represented by the Secretary of Commerce
- Current Assignee Address: US MD Gaithersburg
- Agency: Office of Chief Counsel for National Institute of Standards and Technology
- Main IPC: G01T1/36
- IPC: G01T1/36 ; G01N23/223 ; H05G2/00 ; G01N23/207 ; G01N23/2206

Abstract:
An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.
Public/Granted literature
- US20190064084A1 X-RAY SPECTROMETER Public/Granted day:2019-02-28
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