- Patent Title: Transformer testing device, and method for testing a transformer
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Application No.: US15543063Application Date: 2015-12-18
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Publication No.: US10914778B2Publication Date: 2021-02-09
- Inventor: Dirk Flax , Markus Pütter
- Applicant: OMICRON ELECTRONICS GMBH
- Applicant Address: AT Klaus
- Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee Address: AT Klaus
- Agency: Seyfarth Shaw LLP
- Agent Brian Michaelis
- Priority: ATA50022/2015 20150113
- International Application: PCT/EP2015/080496 WO 20151218
- International Announcement: WO2016/113072 WO 20160621
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H02P13/00

Abstract:
A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).
Public/Granted literature
- US20180003760A1 TRANSFORMER TESTING DEVICE, AND METHOD FOR TESTING A TRANSFORMER Public/Granted day:2018-01-04
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