Invention Grant
- Patent Title: Performance tests of capacitors
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Application No.: US15881031Application Date: 2018-01-26
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Publication No.: US10914790B2Publication Date: 2021-02-09
- Inventor: Kirk Yates , Mohamed Amin Bemat
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/64 ; G06F1/26 ; G04C10/00

Abstract:
Example implementations relate to performance tests of capacitors. In some examples, a controller may comprise a processing resource to measure a change in voltage of a capacitor of a circuit in response to the controller entering a test mode, determine, based on the measured change in the voltage and an impedance of the circuit, a capacitance of the capacitor, compare the determined capacitance of the capacitor to a predetermined capacitance value, and determine, based on the comparison, a performance of the capacitor.
Public/Granted literature
- US20190235008A1 PERFORMANCE TESTS OF CAPACITORS Public/Granted day:2019-08-01
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