The present disclosure relates to generating a measurement sensor profiling summary in relation to a measurement sensor of an electrical measurement system, the measurement sensor being suitable for measuring an electrical property. The profiling summary is generated by obtaining a plurality of profiling results each comprising an estimate of a transfer function of a measurement sensor of the electrical measurement system and a corresponding certainty value indicative of the accuracy of the estimate of the transfer function, wherein the plurality of profiling results are based on estimates of the transfer function of the measurement sensor and corresponding certainty values that were determined by a monitor module of the electrical measurement system during a profiling period of time; and generating a profiling summary based on at least one of the plurality of profiling results.