Invention Grant
- Patent Title: Projection system with offset image
-
Application No.: US16450156Application Date: 2019-06-24
-
Publication No.: US10915010B2Publication Date: 2021-02-09
- Inventor: Alexander Lyubarsky , John Marshall Ferri
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Michelle F. Murray; Charles A. Brill; Frank D. Cimino
- Main IPC: G03B21/14
- IPC: G03B21/14 ; G03B21/00 ; G03B21/26

Abstract:
Described examples include a projection system having projection optics with a projection optics axis tilted from an axis perpendicular to an image target, the projection optics configured to project an image. The projection system also having an image source, the image source configured to provide the image, the image source having an offset from the projection optics axis, a plane of the image source having an angle from perpendicular to the projection optics axis such that a projected image from the image source projected by the projection optics is focused onto the image target along an extent of the projected image.
Public/Granted literature
- US20200004117A1 PROJECTION SYSTEM WITH OFFSET IMAGE Public/Granted day:2020-01-02
Information query