Invention Grant
- Patent Title: Semiconductor device and failure detection system
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Application No.: US16128342Application Date: 2018-09-11
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Publication No.: US10915393B2Publication Date: 2021-02-09
- Inventor: Akihiro Yamate , Yoshitaka Taki , Tatsuya Kamei , Yoichi Yuyama
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2017-222695 20171120
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G11C29/52 ; G11C29/38 ; G06F11/10 ; G06F11/16 ; G06F11/30

Abstract:
Existing semiconductor devices cannot detect a failure occurring in a circuit required for mode switching processing for other than arithmetic cores, so that reliability is inadequate. A semiconductor device of an embodiment of the invention includes: a selector which is provided corresponding to among plural arithmetic cores one used as a checking arithmetic core in lock-step mode and which, in lock-step mode, blocks the interface signals outputted from the corresponding arithmetic core and, in split mode, lets the interface signals outputted from the corresponding arithmetic core through; an access monitor which monitors the interface signals outputted via a selector and, when an abnormal state of the interface signals is detected, outputs an error signal; and an error control unit which outputs, based on the error signal outputted from the access monitor, an abnormal state processing request to a higher-order system.
Public/Granted literature
- US20190155680A1 SEMICONDUCTOR DEVICE Public/Granted day:2019-05-23
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