Invention Grant
- Patent Title: Analysis server device, data analysis system, and data analysis method
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Application No.: US15756321Application Date: 2016-03-28
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Publication No.: US10915563B2Publication Date: 2021-02-09
- Inventor: Susumu Serita , Yoshiyuki Tajima , Tomoaki Akitomi , Fumiya Kudo
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- International Application: PCT/JP2016/059940 WO 20160328
- International Announcement: WO2017/168524 WO 20171005
- Main IPC: G06F16/35
- IPC: G06F16/35 ; G06F16/00 ; H04L12/24

Abstract:
Provided is a technique for extracting a factor (event pattern) that has an influence on an objective index (objective variable). A data analysis device according to the present disclosure performs: a process of generating, with respect to explanatory variable data included in data to be analyzed, a time-series pattern in a predetermined range; a process of calculating a correlation value between the time-series pattern and at least one item of objective variable data included in the data to be analyzed; and a process of outputting, together with the correlation value, the time-series pattern corresponding to the correlation value as an analysis result.
Public/Granted literature
- US20180246958A1 ANALYSIS SERVER DEVICE, DATA ANALYSIS SYSTEM, AND DATA ANALYSIS METHOD Public/Granted day:2018-08-30
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