Invention Grant
- Patent Title: Determining centerlines in elongated structures in images to detect abnormalities
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Application No.: US16179272Application Date: 2018-11-02
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Publication No.: US10916027B2Publication Date: 2021-02-09
- Inventor: Arkadiusz Sitek , Yiting Xie , Ben Graf
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Michael Best & Friedrich LLP
- Main IPC: G06T7/60
- IPC: G06T7/60

Abstract:
Systems and methods for determining an abnormality in an elongated structure in a three dimensional medical image. One system includes an electronic processor. The electronic processor is configured to determine a centerline of the elongated structure in the three dimensional medical image and determine a plurality of two dimensional cross sections of the three dimensional medical image based on the centerline. For each two dimensional cross section of the plurality of two dimensional cross sections, the electronic processor is configured to convert the two dimensional cross section to polar coordinates, fit a line to the elongated structure in the two dimensional cross section converted to polar coordinates, and reconvert the two dimensional cross section to Cartesian coordinates.
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