A resistive memory apparatus and a method of operating a resistive memory apparatus are disclosed. In an embodiment, a resistive memory apparatus can include a memory cell that includes at least two transistors and a resistive element. The resistive memory apparatus can further include a bit line through which data is exchanged with the memory cell, wherein the bit line electronically interconnects with the memory cell, and a bit line regulator connected to the bit line. The bit line regulator can regulate the bit line based on the state of the resistive element. The forming signals and voltage settings can be transmitted over the bit line regulator and across the bit line to the memory cell.