- Patent Title: Programmable resistance memory on thin film transistor technology
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Application No.: US16803992Application Date: 2020-02-27
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Publication No.: US10916317B2Publication Date: 2021-02-09
- Inventor: Shine C. Chung
- Applicant: Attopsemi Technology, Co., LTD
- Applicant Address: TW Hsinchu
- Assignee: Attopsemi Technology, Co., LTD
- Current Assignee: Attopsemi Technology, Co., LTD
- Current Assignee Address: TW Hsinchu
- Main IPC: G11C17/16
- IPC: G11C17/16 ; G11C29/02 ; G11C17/18

Abstract:
Programmable resistive memory can be fabricated with a non-single-crystalline silicon formed on a flexible substrate. The non-single-crystalline silicon can be amorphous silicon, low-temperature polysilicon (LTPS), organic semiconductor, or metal oxide semiconductor. The flexible substrate can be glass, plastics, paper, metal, paper, or any kinds of flexible film. The programmable resistive memory can be PCRAM, RRAM, MRAM, or OTP. The OTP element can be a silicon, polysilicon, organic or metal oxide electrode. The selector in a programmable resistive memory can be a MOS or diode with top gate, bottom gate, inverted, staggered, or coplanar structures.
Public/Granted literature
- US20200219574A1 PROGRAMMABLE RESISTANCE MEMORY ON THIN FILM TRANSISTOR TECHNOLOGY Public/Granted day:2020-07-09
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