Invention Grant
- Patent Title: Sample analysis system
-
Application No.: US15823922Application Date: 2017-11-28
-
Publication No.: US10916334B2Publication Date: 2021-02-09
- Inventor: Hisamitsu Akamaru
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JP2016-229745 20161128
- Main IPC: G01J3/10
- IPC: G01J3/10 ; G01N23/223 ; G01N21/35 ; G16C99/00 ; G01N33/02 ; G16C20/20 ; G01N21/17 ; G01N21/75

Abstract:
A sample analysis system is provided with: a reference substance database including measurement results and component classification information of reference substances obtained by each analysis device on information of each reference substance; a reference substance designation unit; a measurement result collation unit to obtain the commonality of the components, the difference between the physical quantities of the respective components, and the degree of coincidence of the measurement results for each analysis device for the designated reference substance; an integration coincidence degree calculation unit to obtain an integration degree of coincidence; and a judgment unit to judge whether or not the difference between the contents of contained components is within an allowable range and classify the corresponding component based on the component classification information.
Public/Granted literature
- US20180150616A1 SAMPLE ANALYSIS SYSTEM Public/Granted day:2018-05-31
Information query