Invention Grant
- Patent Title: Microwave reflectometry for physical inspections
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Application No.: US16326529Application Date: 2017-08-18
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Publication No.: US10921264B2Publication Date: 2021-02-16
- Inventor: Mohammad Tayeb Ghasr , Reza Zoughi , Satyajeet Shinde , Sasi Jothibasu
- Applicant: The Curators of the University of Missouri
- Applicant Address: US MO Columbia
- Assignee: The Curators of the University of Missouri
- Current Assignee: The Curators of the University of Missouri
- Current Assignee Address: US MO Columbia
- Agency: Stinson LLP
- International Application: PCT/US2017/047489 WO 20170818
- International Announcement: WO2018/035401 WO 20180222
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01N22/00 ; G07D7/10 ; G07D7/202 ; G07D7/1205 ; G01R27/06

Abstract:
Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
Public/Granted literature
- US20190227003A1 MICROWAVE REFLECTOMETRY FOR PHYSICAL INSPECTIONS Public/Granted day:2019-07-25
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