Invention Grant
- Patent Title: Apparatus and method for the photothermal quality control of grain size and layer adhesion of a component
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Application No.: US15568253Application Date: 2016-03-08
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Publication No.: US10921272B2Publication Date: 2021-02-16
- Inventor: Volker Kroeber , Jochen Straehle , Katrin Buechner
- Applicant: Robert Bosch GmbH
- Applicant Address: DE Stuttgart
- Assignee: Robert Bosch GmbH
- Current Assignee: Robert Bosch GmbH
- Current Assignee Address: DE Stuttgart
- Agency: Michael Best & Friedrich LLP
- Priority: DE102015207551.6 20150424
- International Application: PCT/EP2016/054880 WO 20160308
- International Announcement: WO2016/169690 WO 20161027
- Main IPC: G01N1/44
- IPC: G01N1/44 ; G01N25/18

Abstract:
Method (18, 19, 20, 21) for the quality control of a component (4, 4a, 4b, 4c, 4d, i, j, k), wherein the component (4, 4a, 4b, 4c, 4d, i, j, k) is heated (19) by an energy source (5, 5c, 5d), the intensity of which is periodically modulated (18) at at least one frequency ω, and wherein the amplitude A and/or the phase φ of a heat wave (81) which is modulated at the same frequency ω and is emitted by the component (4, 4a, 4b, 4c, 4d, i, j, k) is/are recorded (20), wherein the particle sized of the material, from which the component (4, 4a, 4b, 4c, 4d, i, j, k) is constructed, and/or the adhesion properties F of a functional layer (42) applied to the component (4, 4a, 4b, 4c, 4d, i, j, k) are evaluated (21) from the amplitude A and/or from the phase φ. Apparatus (100) for carrying out the method.
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