Invention Grant
- Patent Title: Computer system and method for monitoring key performance indicators (KPIs) online using time series pattern model
-
Application No.: US16307620Application Date: 2017-07-07
-
Publication No.: US10921759B2Publication Date: 2021-02-16
- Inventor: Jian Ma , Hong Zhao , Ashok Rao , Andrew L. Lui , Willie K. C. Chan
- Applicant: Aspen Technology, Inc.
- Applicant Address: US MA Bedford
- Assignee: Aspen Technology, Inc.
- Current Assignee: Aspen Technology, Inc.
- Current Assignee Address: US MA Bedford
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- International Application: PCT/US2017/041003 WO 20170707
- International Announcement: WO2018/009733 WO 20180111
- Main IPC: G05B13/04
- IPC: G05B13/04 ; G05B23/02

Abstract:
Embodiments are directed to computer methods and systems that build and deploy a pattern model to detect an operating event in an online plant process. To build the pattern model, the methods and systems define a signature of the operating event, such that the defined signature contains a time series pattern for a KPI associated with the operating event. The methods and systems deploy the pattern model to automatically monitor, during online execution of the plant process, trends in movement of the KPI as a time series. The methods and systems determine, in real-time, a distance score between a range of the monitored time series and the time series pattern contained in the defined signature. The methods and systems automatically detect the operating event in the online industrial process based on the determined distance score, and alter parameters of the process (e.g., valves, actuators, etc.) to prevent the operating event.
Public/Granted literature
Information query