Invention Grant
- Patent Title: Automated machine analysis
-
Application No.: US16277038Application Date: 2019-02-15
-
Publication No.: US10921777B2Publication Date: 2021-02-16
- Inventor: Michael David Rich , Keith Allen Walton
- Applicant: Michael David Rich , Keith Allen Walton
- Applicant Address: US TN Clinton; US VA Abingdon
- Assignee: Michael David Rich,Keith Allen Walton
- Current Assignee: Michael David Rich,Keith Allen Walton
- Current Assignee Address: US TN Clinton; US VA Abingdon
- Agency: Dentons Cohen & Grigsby P.C.
- Main IPC: G05B19/4065
- IPC: G05B19/4065 ; B23Q17/09 ; G06N20/00

Abstract:
A method for automated condition monitoring whereby techniques of automated vibration analysis and signal processing are combined with deep learning/machine learning techniques for an enhanced system of automated anomaly detection, problem classification, and problem regression. The method may be implemented in software, firmware or hardware to run autonomously. Machines monitored and analyzed according to the disclosed method are typically found in industrial plants or commercial applications, but the disclosed invention may be applied to any rotating equipment such as motors, fans, pumps, compressors, and etc., in any environment where they are functioning.
Public/Granted literature
- US20190250585A1 RAPTOR AUTOMATED CONDITION MONITORING Public/Granted day:2019-08-15
Information query
IPC分类: