Invention Grant
- Patent Title: Material testing machine and gripping force detecting method
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Application No.: US16166185Application Date: 2018-10-22
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Publication No.: US10928281B2Publication Date: 2021-02-23
- Inventor: Shogoro Iwakiri , Zen Miyazaki
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2017-224874 20171122
- Main IPC: G01N3/08
- IPC: G01N3/08 ; G01N3/04 ; G01N29/44 ; G01N3/06 ; G01H13/00 ; G01N3/62 ; G01N3/30 ; G01N29/12 ; G01N3/22

Abstract:
Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.
Public/Granted literature
- US20190154554A1 MATERIAL TESTING MACHINE AND GRIPPING FORCE DETECTING METHOD Public/Granted day:2019-05-23
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