Invention Grant
- Patent Title: Configurable retro-reflective sensor system for the improved characterization of the properties of a sample
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Application No.: US16306492Application Date: 2017-06-01
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Publication No.: US10928307B2Publication Date: 2021-02-23
- Inventor: Matthias Hartrumpf , Christian Negara
- Applicant: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E. V.
- Applicant Address: DE Munich
- Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E. V.
- Current Assignee: FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E. V.
- Current Assignee Address: DE Munich
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102016209723.7 20160602
- International Application: PCT/EP2017/063248 WO 20170601
- International Announcement: WO2017/207681 WO 20171207
- Main IPC: G01N21/21
- IPC: G01N21/21 ; G01N21/25 ; G01N21/55 ; G02B5/122

Abstract:
Disclosed is a retroreflector-based sensor system for optical characterization of a sample, having a transmitter for irradiating the sample, a retroflector positioned behind the sample, the transmitter, the sample, and the retroreflector being positioned such that radiation reflected back from the retroreflector is again incident on the sample and is reflected back from the latter in the direction towards the transmitter, and a receiver which is positioned in the receiving beam path such that it detects radiation reflected back from the retroreflector, incident again on the sample and reflected back from the latter, in the direction towards the transmitter.
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