Invention Grant
- Patent Title: Nondestructive inspection using dual pulse-echo ultrasonics and method therefor
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Application No.: US15971270Application Date: 2018-05-04
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Publication No.: US10928362B2Publication Date: 2021-02-23
- Inventor: Alan Matthew Finn , Amit Surana , Matthew O. Williams , Edgar A. Bernal , Ozgur Erdinc
- Applicant: United Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Farmington
- Agency: Bachman & LaPointe, P.C.
- Main IPC: G01N29/26
- IPC: G01N29/26 ; G01N29/11 ; G01N29/44

Abstract:
A method for nondestructive inspection of a component, the method includes determining a first pulse-echo scan from a first side of a component; determining a second pulse-echo scan from a second side of the component; determining a through-transmission scan based on the first pulse-echo scan, the second pulse-echo scan, and a model of the component, the model comprises a rigid internal structure of the component; and classifying the component based on comparing the through-transmission scan to a “gold” model.
Public/Granted literature
- US20190339234A1 NONDESTRUCTIVE INSPECTION USING DUAL PULSE-ECHO ULTRASONICS AND METHOD THEREFOR Public/Granted day:2019-11-07
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