Invention Grant
- Patent Title: Integrated standardized metrology system (ISMetS)
-
Application No.: US15942269Application Date: 2018-03-30
-
Publication No.: US10929574B2Publication Date: 2021-02-23
- Inventor: Glen Anthony Journeay , Paul F. Sjoholm , Jonathan Gorman Cook, Jr. , Khanh Quoc Hoang
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Haynes and Boone LLP
- Main IPC: G06F17/20
- IPC: G06F17/20 ; G06F30/17 ; B64F5/10 ; G06F3/048 ; G06F16/83 ; G06F16/11

Abstract:
Systems, methods, and apparatus for an integrated standardized metrology system (ISMetS) are disclosed. A disclosed metrology system comprises at least one processor to receive an XML metrology file that comprises at least one metrology action for a metrology instrument to measure at least one object, to translate the XML metrology file into a human machine interface (HMI) metrology file, to generate a graphical user interface (GUI) based on the HMI metrology file, to generate a HMI metrology command file according to a command from a user via the GUI, to translate the HMI metrology command file into a metrology instrument software command file, and to translate the metrology instrument software command file into a metrology instrument command file. The system further comprises the metrology instrument to measure at least one object, according to the metrology instrument command file, to obtain measurements for at least one object.
Public/Granted literature
- US20190303529A1 INTEGRATED STANDARDIZED METROLOGY SYSTEM (ISMETS) Public/Granted day:2019-10-03
Information query