Invention Grant
- Patent Title: Semiconductor storage device having a temperature sensor that generates a temperature signal based on which applied voltages are generated
-
Application No.: US16556047Application Date: 2019-08-29
-
Publication No.: US10930357B2Publication Date: 2021-02-23
- Inventor: Yuri Terada , Noriyasu Kumazaki , Yasufumi Kajiyama , Akio Sugahara , Masahiro Yoshihara
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: Kim & Stewart LLP
- Priority: JPJP2018-238706 20181220
- Main IPC: G11C16/30
- IPC: G11C16/30 ; G11C16/32 ; G11C16/10 ; G11C16/26 ; G06F3/06 ; G01K3/10 ; G01K1/14

Abstract:
A semiconductor storage device includes a memory cell array, a temperature sensor configured to generate a first temperature signal corresponding to a temperature of the memory cell array in response to a first command periodically generated during a waiting period of the memory cell array, a storage circuit configured to store the first temperature signal and update the first temperature signal each time the first command is generated during the waiting period, and a voltage generation circuit configured to generate a voltage to be applied to the memory cell array based on the first temperature signal stored in the storage circuit.
Information query