Invention Grant
- Patent Title: Interconnect device and method
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Application No.: US16549110Application Date: 2019-08-23
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Publication No.: US10930590B1Publication Date: 2021-02-23
- Inventor: Dian-Sheg Yu , Ren-Fen Tsui , Jhon Jhy Liaw , Ying-Jhe Fu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: G11C8/00
- IPC: G11C8/00 ; H01L23/528 ; H01L27/11 ; H01L23/522 ; H01L21/768 ; G11C11/412 ; G11C11/418

Abstract:
In some embodiments of the method, patterning the opening includes: projecting a radiation beam toward the second dielectric layer, the radiation beam having a pattern of the opening. In some embodiments of the method, the single-patterning photolithography process is an extreme ultraviolet (EUV) lithography process. In some embodiments of the method, filling the opening with the conductive material includes: plating the conductive material in the opening; and planarizing the conductive material and the second dielectric layer to form the first metal line from remaining portions of the conductive material, top surfaces of the first metal line and the second dielectric layer being planar after the planarizing.
Public/Granted literature
- US20210057327A1 INTERCONNECT DEVICE AND METHOD Public/Granted day:2021-02-25
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