Invention Grant
- Patent Title: Method and device for measuring features on workpieces
-
Application No.: US15533235Application Date: 2015-12-11
-
Publication No.: US10935366B2Publication Date: 2021-03-02
- Inventor: Ralf Christoph , Ingomar Schmidt , Volker Wegner , Matthias Andräs , Ulrich Neuschaefer-Rube , Andreas Ettemeyer , Mehmet Demirel , Sabine Linz-Dittrich , Benjamin Hopp
- Applicant: WERTH MESSTECHNIK GMBH
- Applicant Address: DE Giessen
- Assignee: WERTH MESSTECHNIK GMBH
- Current Assignee: WERTH MESSTECHNIK GMBH
- Current Assignee Address: DE Giessen
- Agency: Ladas & Parry LLP
- Agent Malcolm J. MacDonald
- Priority: DE102014118525.0 20141212,DE102015112521.8 20150730,DE102015120060.0 20151119
- International Application: PCT/EP2015/079339 WO 20151211
- International Announcement: WO2016/092053 WO 20160616
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B5/012 ; G01B11/245 ; H04N5/225 ; G06T7/00 ; H04N5/369

Abstract:
A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.
Public/Granted literature
- US20180106595A1 METHOD AND DEVICE FOR MEASURING FEATURES ON WORKPIECES Public/Granted day:2018-04-19
Information query