Invention Grant
- Patent Title: High-G shock testing machine
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Application No.: US16236416Application Date: 2018-12-29
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Publication No.: US10935456B2Publication Date: 2021-03-02
- Inventor: Jahangir S Rastegar , Jacques Fischer , Dake Feng
- Applicant: Omnitek Partners LLC
- Applicant Address: US NY Ronkonkoma
- Assignee: Omnitek Partners LLC
- Current Assignee: Omnitek Partners LLC
- Current Assignee Address: US NY Ronkonkoma
- Main IPC: G01M7/08
- IPC: G01M7/08 ; G01N3/307 ; G01N3/31

Abstract:
A shock testing machine including: a test platform for holding one or more objects to be shock tested, the test platform having an impact surface; a fixed member having a surface disposed a predetermined distance from a corresponding surface of the test platform, the test platform being movable such that the surface of the test platform can contact the corresponding surface of the fixed member upon an impact to the impact surface; and a flywheel having one or more cams for contacting the impact surface upon rotation of the flywheel such that the impact of each of the one or more cams on the impact surface causes the surface of the test platform to impact the corresponding surface of the fixed member to produce a shock in the one or more objects to be tested.
Public/Granted literature
- US20190154542A1 High-G Shock Testing Machine Public/Granted day:2019-05-23
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