Invention Grant
- Patent Title: Method and system for determining molecular structure
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Application No.: US16450321Application Date: 2019-06-24
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Publication No.: US10935506B2Publication Date: 2021-03-02
- Inventor: Bart Buijsse , Abhay Kotecha
- Applicant: FEI Company
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/04 ; G01N23/205

Abstract:
Molecular structure may be determined based on structure factors solved from the diffraction pattern and the electron microscopy image of the sample. In particular, the amplitudes of the structure factors may be determined based on intensities of diffraction peaks in the multiple diffraction patterns. The phases of the structure factors may be determined based on electron microscopy images and the intensities of the diffraction peaks.
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