A measurement system for testing a device under test is described that comprises at least one signal unit for processing a signal, at least two measurement antennas, at least two reflectors, a shielded space, and a testing position for the device under test. Each measurement antenna is orientated with respect to the testing position such that the testing position is located in at least one of a side lobe area and a back lobe area of the measurement antennas. The reflectors are located such that each reflector generates and/or collimates a planar wave at different angles with respect to the testing position. Further, a method for performing test measurements is described.