In situ verification of guided wave radar device
Abstract:
The application discloses a method for verifying the accuracy of a guided-wave radar measuring device used in process automation. The method includes sending measuring radar waves to a built-in verification circuit of a known and verified length and performing time-of-flight analysis on the measuring radar wave reflected by the built-in verification circuit. The application also discloses a guided-wave radar device having a built-in verification circuit.
Information query
Patent Agency Ranking
0/0